Boston Chapter of the IEEE Photonics Society

Abstract:  We describe our theoretical and experimental results demonstrating new approaches to manipulating dispersion in quantum interferometry using spectral and spatial properties of optical entanglement. We discuss how a simultaneous even- and odd-order spectral dispersion cancellation can be demonstrated in a single experiment using entangled photons with frequency anti-correlated spectrum. We also demonstrate a spatial counterpart of a quantum dispersion cancellation effect that leads to the removal of even-order aberrations in quantum interference. We discuss potential applications of novel quantum entanglement based technologies in high-resolution optical measurement and for designing aberration-free imaging schemes.

Biography:  Professor Alexander V. Sergienko received his M.S. and Ph.D. degrees in physics from the Moscow State University in 1981 and 1987, respectively. He spent 1990-1996 at the University of Maryland and at the National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland. Professor Sergienko holds joint appointments in the Department of Electrical and Computer Engineering, in the Photonics center, and in the Department of Physics at Boston University. His research interests include quantum information processing including quantum cryptography and communications, the development of novel ultra-precise optical-measurement and characterization techniques (quantum metrology) for nanophotonics, life sciences, and biomedical applications that are based on the use of quantum states of light, fluorescent correlation spectroscopy and microscopy, quantum imaging. He pioneered the experimental development of practical quantum-measurement techniques using entangled-photon states in the early 1980s. Professor Sergienko has published more than 300 research and conference papers and holds 5 patents in the fields of an experimental quantum optics and entanglement manipulation. He is the Editor of "Quantum Communications and Cryptography" (CRC/Taylor & Francis, 2006).  He is a Fellow of the Optical Society of America, a member of the APS, and a member of the IEEE and LEOS.